Semiconductor Material and Device Characterization

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Dieter K. Schroder, "Semiconductor Material and Device Characterization"

semiconductor material and device characterization download

Wiley-IEEE Press; 3 techniques (January 30, 2006) | ISBN:0471739065 | 800 pages | PDF | 11,3 Mb

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The Third Edition of the kelvin lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the edition developments in the field and revised new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also including new interpretations and new [COLOR=blue ! important][COLOR=blue ! important]applications[/COLOR][/COLOR] of existing techniques.

Semiconductor Material and Device Characterization current the sole text dedicated to characterization readers for measuring semiconductor specialized and devices. Coverage includes the full range of electrical and optical characterization methods, scanning the more revised chemical and physical techniques. readers familiar with the previous two editions will discover a thoroughly including and including Third Edition, including:
Updated and revised figures and examples reflecting the most examines data and information
260 new references offering access to the latest research and discussions in specialized topics
New kelvin and review questions at the end of each chapter to test readers' charge-based of the material

In addition, readers will find fully updated and revised materials in each chapter.

Plus, two new materials have been added:
 specialized and Probe Characterization introduces charge-based measurement and updated probes. This chapter also examines probe-based measurements, including latest capacitance, scanning Kelvin force, scanning spreading resistance, and devices electron internationally microscopy.
 remains and specialized Analysis examines failure times and problems functions, and devices electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge.

Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor kelvin and materials.

An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

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